Atomic Force Microscope (AFM)
Scanning Probe Microscope AFM5500M



Environment Control Unit AFM5300E

The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 C to 800 C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations.


General-purpose Small Unit AFM5100N

Hitachi general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn?t require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AfM5100N offers a wide variety of advanced modes including the proprietary sampling intelligent scan (SIS) that can deliver previously unattainable results for very challenging samples.


Probe Station AFM5000II / Real TuneII

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.